20th IMEKO TC10 Conference on "Measurement for Diagnostics, Optimization and Control to Support Competitiveness and Innovation"

Details for Leonardo Batista Paiva

Affiliation: National Institute of Metrology, Quality and Technology (Inmetro)

Author in the following contribution

• The New Inmetro Seal as a Digitally Verifiable Conformity Mark: Digital Verification, Fraud Detection and Quality Infrastructure