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The International Measurement Confederation IMEKO, Technical Committee 10 on Measurement for Diagnostics, Optimization and Control (https://www.imeko.org/index.php/tc10-homepage) kindly invites you to attend the 19th IMEKO TC10 Conference: “MACRO meets NANO in Measurement for Diagnostics, Optimization and Control” to be held in Delft, The Netherlands on September 21-22, 2023.
The Conference is a forum for advancing knowledge and exchange ideas on methods, principles, instruments, technologies and IT tools, standards, industrial applications, conformity assessment, quality management and measurement challenges on Diagnostics, Optimization and Control as well as their diffusion across the scientific community. Participants have an excellent opportunity to meet top specialists from industry and academia all over the world and to enhance their international cooperation. The programme will feature scientists and experts as leading keynote speakers for selected presentations on the main topics of the Conference.
CALL FOR PAPERS
Authors are kindly invited to submit extended abstracts in the appointed scientific topics, three to four pages long in A4 format. The abstract should report original research results of the theoretical or applied nature and should explain the significance of the contribution to the research field. The abstracts will be reviewed by the International Programme Committee.
