Browse Author Index

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Ocaña, Jose Luis, Centro láser UPM
Ogushi, Koji, National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
Ogushi, Koji, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology
Ojanen-Saloranta, Maija, MIKES Metrology, VTT Technical Research Centre of Finland Ltd, Espoo, Finland
Oliva, Gabriele, University Campus Bio-Medico, Rome, Italy.
Oliveri, Alberto, Department of Electrical, Electronic, Telecommunications Engineering and Naval Architecture (DITEN), University of Genoa
Ometto, Antonio, Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia - Università dell'Aquila
Oota, Akihiro, <p><span lang="EN-GB" style="font-family: &quot;Times New Roman&quot;,&quot;serif&quot;; font-size: 12pt; mso-fareast-font-family: &quot;MS 明朝&quot;; mso-ansi-language: EN-GB; mso-fareast-language: JA; mso-bidi-language: AR-SA;"> </span></p>
Origlia, Claudio, INRiM
Origlia, Claudio, INRIM - National Institute of Metrological Research
Ospishchev, Mikhail Aleksandrovich, RosIntecS LLC
Ota, Akihiro, National Metrology Institute of Japan
Ota, Akihiro, National Institute of Advanced Industrial Science and Tehcnology

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(C) IMEKO TC8, TC23 and TC24