Browse Author Index

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S

Sabuga, Wladimir, PTB
Sadıkoğlu, Enver, TÜBİTAK Ulusal Metroloji Enstitüsü (UME)
Saenkhum, Nattapon, National Institute of Metrology (Thailand)
Saenz, María Ana, <p class="Affiliation">ETSI ICAI (Universidad Pontificia Comillas)</p>
Salbol, Sven Erik, <p><span lang="DA" style="font-family: &quot;Times New Roman&quot;,&quot;serif&quot;; font-size: 9pt; mso-bidi-font-size: 12.0pt; mso-fareast-font-family: &quot;Times New Roman&quot;; mso-ansi-language: DA; mso-fareast-language: HR; mso-bidi-language: AR-
Salceanu, Alexandru, Technical University of Iasi, Faculty of Electrical Engineering

Š

Šaliga, Jan, Faculty of Electrical Engineering and Informatics, Technical University of Košice

S

Salvietti, Gionata, Istituto Italiano di Tecnologia
Salvietti, Gionata, Istituto Italiano di Tecnologia (Italy)
Sanfilippo, Stephane, Paul Scherrer Institut 5232 Villigen PSI
Sanponpute, Tassanai, National Institute of Metrology (Thailand)
Santillo, Luca, GUFPI-ISMA Gruppo Utenti Function Point Italia - Italian Software Metrics Association
Santos, José, <p>Instituto de Telecomunicações, DEEC, IST, UL</p>
Sarmiento, Roberto, Departamento de Ingeniería Electrónica y Automática. Universidad de Las Palmas de Gran Canaria.
Satler, Massimo
Sawa, Takeshi, Mitutoyo Corporation
Sawamura, Tomoki, VLSI Design and Education Center, the University of Tokyo
Scarano, Valeria Leonarda, Politecnico di Bari
Schäck, Marco M., Hottinger Baldwin Messtechnik GmbH (HBM), Darmstadt, Germany
Schäfer, André, <p>HBM</p><p>HOTTINGER BALDWIN MESSTECHNIK GMBH</p><p>Im Tiefen See 45</p><p>64293 Darmstadt</p><p>Germany</p>
Schäfer, André, <p>HBM</p><p>Hottinger Baldwin Messtechnik GmbH</p><p>Im Tiefen See 45, 64293 Darmstadt</p><p> </p>
Scheggi, Stefano, Università degli Studi di Siena
Schenk, Wolfgang, OMICRON electronics GmbH
Schiavi, Alessandro, <p>INRIM -National Institute of Metrological Research</p><p>str. della Cacce 91, 10135 Torino, Italy</p>
Schiavi, Alessandro, INRIM -National Institue of Metrological Research

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